*001269858
*00520250613133615.0
*007ta
*008110826r19901990no            000 0 eng
*00901256cam a2200301 c 4500
*019  $bl
*020  $a8259560178
*035  $a(EXLNZ-47BIBSYS_NETWORK)999102490754702201
*035  $a(NO-LaBS)14206035(bibid)
*035  $a(NO-TrBIB)910249075
*035  $a910249075-47bibsys_network
*040  $aNO-OsNB$bnob$ekatreg
*080  $a537.533.35
*080  $a669.715
*1001 $aBardal, Asgeir$0(NO-TrBIB)90412836$_39705100
*24510$aInterfaces in a slowly cooled Al-SiC composite$cAsgeir Bardal and Ragnvald Høier
*260  $aTrondheim$bSINTEF, Applied Physics$c1990
*300  $aS. 380-381$bill.
*4901 $aSINTEF report$vSTF19 A90030
*533  $aElektronisk reproduksjon$b[Norge]$cNasjonalbiblioteket Digital$d2016-12-15
*534  $aFotokopi av: Proceedings of the XIIth International Congress for Electron Microscopy. San Francisco Press, c1990
*650 7$aAluminiumlegeringer$2tekord$_186602400
*650 7$aElektronmikroskopi$2tekord$_187335500
*7001 $aHøier, Ragnvald$d1938-2009$0(NO-TrBIB)90095307$_35617200
*830 0$aSINTEF rapport (SINTEF. Målefysisk laboratorium : trykt utg.)$vSTF19 A90030$w998110210764702201$_14526900
*85641$3Fulltekst$uhttps://urn.nb.no/URN:NBN:no-nb_digibok_2016121548243$yNettbiblioteket$zDigital representasjon
*901  $a80
*999  $aoai:nb.bibsys.no:999102490754702202$b2021-11-14T20:06:18Z$z999102490754702202
^