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*008110826s1990    no            000 0 eng
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*1001 $aGuo, Yongxiang$0(NO-TrBIB)90529070$_53166500
*24510$aExperimental high-resolution electron microscopy from GaAs and GaAs/AlGaAs heterostructures$cYong Xiang Guo and Ragnvald Høier
*260  $aTrondheim$bSINTEF, Applied Physics$c1990
*300  $a24 bl.$bill.
*4901 $aSINTEF report$vSTF19 A90018
*533  $aElektronisk reproduksjon$b[Norge]$cNasjonalbiblioteket Digital$d2010-10-08
*650 7$aElektronmikroskopi$2tekord$_187335500
*650 7$aGalliumarsenid (Halvledere)$2tekord$_186897700
*7001 $aHøier, Ragnvald$d1938-2009$0(NO-TrBIB)90095307$_35617200
*830 0$aSINTEF rapport (SINTEF. Målefysisk laboratorium : trykt utg.)$vSTF19 A90018$w998110210764702201$_14526900
*85641$3Fulltekst$uhttps://urn.nb.no/URN:NBN:no-nb_digibok_2010100809001$yNettbiblioteket$zDigital representasjon
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*999  $aoai:nb.bibsys.no:999100599184702202$b2021-11-14T20:58:42Z$z999100599184702202
^